Wu, Jinxuan
(2012)
Optical and Electrical Properties of Epitaxial Silver Films Grown on Silicon.
Master's Thesis, University of Pittsburgh.
(Unpublished)
Abstract
Light absorption and photocarrier transport are commonly important processes of photovoltaic energy conversion. In this thesis we have explored nanostructured metal contacts on semiconductor surfaces that may provide a synergistic improvement of these fundamental processes therefore the overall cell efficiency. This research is based on the previous work at Prof. Kim’s lab: a simple thin-film deposition process was developed that can grow nanostructured metal films on native-oxide covered silicon surface [Phys Rev B 75, 205306 (2007); J Appl Phys 103, 103507 (2008)]. This thin-film process involves the Stranski-Krastanov growth mode, that is, growth of a thin wetting layer followed by formation of 3D nano-islands, both in good epitaxial relationship with Si substrate. The process temperature is significantly lower than that of conventional silver thick-film process. In this study we have investigated the potential to use the nanostructured epitaxial metal contacts on Si as a means to achieve low contact resistivity and also to enhance light trapping/coupling. We characterized the optical reflectance at various incident angles. The film and contact resistivities of Ag on Si were also characterized for various different film thicknesses.
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Details
| Item Type: |
University of Pittsburgh ETD
|
| Status: |
Unpublished |
| Creators/Authors: |
|
| ETD Committee: |
|
| Date: |
4 June 2012 |
| Date Type: |
Publication |
| Defense Date: |
28 March 2012 |
| Approval Date: |
4 June 2012 |
| Submission Date: |
29 March 2012 |
| Access Restriction: |
No restriction; Release the ETD for access worldwide immediately. |
| Number of Pages: |
70 |
| Institution: |
University of Pittsburgh |
| Schools and Programs: |
Swanson School of Engineering > Electrical Engineering |
| Degree: |
MSEE - Master of Science in Electrical Engineering |
| Thesis Type: |
Master's Thesis |
| Refereed: |
Yes |
| Uncontrolled Keywords: |
Scattering, Transfer length method, Transmission line model, Ohmic contact, Contact resistivity |
| Date Deposited: |
04 Jun 2012 17:37 |
| Last Modified: |
15 Nov 2016 13:57 |
| URI: |
http://d-scholarship.pitt.edu/id/eprint/11612 |
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