Xu, Yi
(2013)
TOWARDS RELIABLE NANOPHOTONIC INTERCONNECTION NETWORK DESIGNS.
Doctoral Dissertation, University of Pittsburgh.
(Unpublished)
Abstract
As technology scales into deep submicron domains, electrical wires start to face critical challenges in latency and power since they do not scale well as compared to transistors. Many recent researches have shifted focus to optical on-chip interconnection because of its promises of high bandwidth density, low propagation delay, distance-independent power consumption (compared to metal), and natural support for multicast and broadcast.
Unfortunately, while optical interconnect provides many attractive and promising features, there are also fundamental challenges in fabrication of those devices to providing robust and reliable on-chip communication. Microrings resonators, the basic components of nanophotonic interconnect, may not resonate at the designated wavelength under fabrication errors (a.k.a. process variations PV) or thermal fluctuation (TF), leading to communication errors and bandwidth loss. In addition, the power overhead required to correct the drift can overturn the benefits promised by this new technology.
Hence, the objective of the thesis is to maximize network bandwidth through proper arrangement among microrings and wavelengths with minimum tuning power requirement. I propose the following techniques to achieve my goals. First, I will present a series of solutions, called ``MinTrim'', to address the wavelength drifting problem of microrings and subsequent bandwidth loss problem of an optical network, due to the PV. Next, to mitigate bandwidth loss and performance degradation caused by PV and TF, I will propose an architecture-level approach, ``BandArb'', which allocates the bandwidth at runtime according to network demands and temperature with low computation overhead. Finally, I will conclude the thesis and discuss the future works in this field.
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Details
| Item Type: |
University of Pittsburgh ETD
|
| Status: |
Unpublished |
| Creators/Authors: |
|
| ETD Committee: |
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| Date: |
31 January 2013 |
| Date Type: |
Publication |
| Defense Date: |
19 November 2012 |
| Approval Date: |
31 January 2013 |
| Submission Date: |
20 November 2012 |
| Access Restriction: |
5 year -- Restrict access to University of Pittsburgh for a period of 5 years. |
| Number of Pages: |
100 |
| Institution: |
University of Pittsburgh |
| Schools and Programs: |
Swanson School of Engineering > Electrical Engineering |
| Degree: |
PhD - Doctor of Philosophy |
| Thesis Type: |
Doctoral Dissertation |
| Refereed: |
Yes |
| Uncontrolled Keywords: |
reliability, crossbar, algorithm, power trimming |
| Date Deposited: |
31 Jan 2013 21:41 |
| Last Modified: |
31 Jan 2018 06:15 |
| URI: |
http://d-scholarship.pitt.edu/id/eprint/16459 |
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