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Smoke and particle detector using tritiated semiconductor foil

Liu, B and Alvarez-Ossa, D and Kherani, NP and Zukotynski, S and Chen, KP (2008) Smoke and particle detector using tritiated semiconductor foil. Fusion Science and Technology, 54 (2). 631 - 634. ISSN 1536-1055

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Abstract

A smoke and particle ionization detector using tritiated amorphous silicon film as the radiation source is demonstrated. The ion chamber design includes both bipolar and unipolar region; the unipolar region is defined as the volume space extending beyond the range of ionizing particles. Attachment of ions to particulate matter in the unipolar region considerably reduces the mobility of the carriers, thus forming a space charge cloud accompanied by a reduction in the electrical field strength, thereby enhancing the particulate detection responsivity. Tritium βs have a maximum range of about 6 mm in air, which makes the detector compact. Owing to the potential of increased specific activity, it results in a gamma-free detector with improved sensitivity. The results show that this gamma-free detector is several-fold to forty-fold more responsive than traditional ionization detectors using Am-241. In addition, this ion chamber can function as a dual detector having both photoelectric and ionization detector responsivities.


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Details

Item Type: Article
Status: Published
Creators/Authors:
CreatorsEmailPitt UsernameORCID
Liu, B
Alvarez-Ossa, D
Kherani, NP
Zukotynski, S
Chen, KPpec9@pitt.eduPEC90000-0002-4830-0817
Date: 1 January 2008
Date Type: Publication
Access Restriction: No restriction; Release the ETD for access worldwide immediately.
Journal or Publication Title: Fusion Science and Technology
Volume: 54
Number: 2
Page Range: 631 - 634
Event Type: Conference
DOI or Unique Handle: 10.13182/fst08-a1894
Institution: University of Pittsburgh
Schools and Programs: Swanson School of Engineering > Electrical and Computer Engineering
Refereed: Yes
ISSN: 1536-1055
Date Deposited: 09 Jun 2014 15:24
Last Modified: 15 Jan 2021 15:55
URI: http://d-scholarship.pitt.edu/id/eprint/21745

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