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High-pressure and high-temperature tritium apparatus for the tritiation of materials

Antoniazzi, AB and Morton, CS and Chen, KP and Liu, B (2008) High-pressure and high-temperature tritium apparatus for the tritiation of materials. Fusion Science and Technology, 54 (2). 635 - 638. ISSN 1536-1055

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Abstract

A tritium exposure apparatus has been designed and built for the purposes of generating a high-pressure tritium atmosphere at 523 K. The loading system consists of a uranium tritide storage bed, an intermediate tritium transfer chamber filled with 5A molecular sieve, and the sample exposure chamber. The loading system resides in a sealed glovebox with a nitrogen atmosphere that is continually purged through a Glovebox Clean-up System. The tritium used in each loading experiment is approximately 6000 Ci (22 TBq). The process entails transferring the tritium inventory from the uranium storage bed to the cryogenically cooled (77 K) molecular sieve chamber. The molecular sieve at liquid nitrogen temperature is capable of adsorbing tritium to densities of 290 Ci/gram at one atmosphere. At 523 K a maximum tritium pressure of 21 MPa is achieved. The loading apparatus is used to develop high-density radioactive isotope fuel for self-powered microelectronic and micromechanical devices. This paper presents the design specifics of the tritium exposure apparatus, the steps taken in generating the high-temperature, high-pressure tritium atmosphere and the performance characteristics of the apparatus. Additionally, the handling practices and equipment utilized to conduct the tests safely are presented.


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Details

Item Type: Article
Status: Published
Creators/Authors:
CreatorsEmailPitt UsernameORCID
Antoniazzi, AB
Morton, CS
Chen, KPpec9@pitt.eduPEC90000-0002-4830-0817
Liu, B
Date: 1 January 2008
Date Type: Publication
Access Restriction: No restriction; Release the ETD for access worldwide immediately.
Journal or Publication Title: Fusion Science and Technology
Volume: 54
Number: 2
Page Range: 635 - 638
Event Type: Conference
DOI or Unique Handle: 10.13182/fst08-a1895
Institution: University of Pittsburgh
Schools and Programs: Swanson School of Engineering > Electrical and Computer Engineering
Refereed: Yes
ISSN: 1536-1055
Date Deposited: 09 Jun 2014 15:23
Last Modified: 15 Jan 2021 15:55
URI: http://d-scholarship.pitt.edu/id/eprint/21746

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