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Trimming phase and birefringence errors in planar lightwave circuits with deep ultraviolet femtosecond laser

Chen, Q and Chen, KP and Buric, M and Nikumb, S (2004) Trimming phase and birefringence errors in planar lightwave circuits with deep ultraviolet femtosecond laser. Electronics Letters, 40 (19). 1179 - 1181. ISSN 0013-5194

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Abstract

A deep ultraviolet femtosecond laser was employed to trim phase and birefringence errors in silica planar lightwave circuits. A permanent refractive index change of ∼3.8 × 10-4 and a birefringence change of 1.0 × 10-4 were induced in hydrogen-free Mach-Zehnder planar waveguide circuits. The ultrafast laser enhances the ultraviolet photo-sensitivity response in silica waveguides by two orders of magnitude greater than that of a nanosecond 248 nm KrF excimer laser.


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Details

Item Type: Article
Status: Published
Creators/Authors:
CreatorsEmailPitt UsernameORCID
Chen, Q
Chen, KPpec9@pitt.eduPEC9
Buric, M
Nikumb, S
Date: 16 September 2004
Date Type: Publication
Journal or Publication Title: Electronics Letters
Volume: 40
Number: 19
Page Range: 1179 - 1181
DOI or Unique Handle: 10.1049/el:20045975
Schools and Programs: Swanson School of Engineering > Electrical and Computer Engineering
Refereed: Yes
ISSN: 0013-5194
Date Deposited: 21 Oct 2014 16:35
Last Modified: 31 Mar 2019 03:55
URI: http://d-scholarship.pitt.edu/id/eprint/23061

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