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Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantilever

UNSPECIFIED (2012) Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantilever. Nanotechnology, 23 (49). ISSN 0957-4484

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Abstract

We report a wear-resistant ultrananocrystalline (UNCD) diamond tip integrated onto a heated atomic force microscope (AFM) cantilever and UNCD tips integrated into arrays of heated AFM cantilevers. The UNCD tips are batch-fabricated and have apex radii of approximately 10 nm and heights up to 7 μm. The solid-state heater can reach temperatures above 600 °C and is also a resistive temperature sensor. The tips were shown to be wear resistant throughout 1.2 m of scanning on a single-crystal silicon grating at a force of 200 nN and a speed of 10 μm s-1. Under the same conditions, a silicon tip was completely blunted. We demonstrate the use of these heated cantilevers for thermal imaging in both contact mode and intermittent contact mode, with a vertical imaging resolution of 1.9 nm. The potential application to nanolithography was also demonstrated, as the tip wrote hundreds of polyethylene nanostructures. © 2012 IOP Publishing Ltd.


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Details

Item Type: Article
Status: Published
Date: 14 December 2012
Date Type: Publication
Access Restriction: No restriction; Release the ETD for access worldwide immediately.
Journal or Publication Title: Nanotechnology
Volume: 23
Number: 49
DOI or Unique Handle: 10.1088/0957-4484/23/49/495302
Institution: University of Pittsburgh
Schools and Programs: Swanson School of Engineering > Mechanical Engineering and Materials Science
Refereed: Yes
ISSN: 0957-4484
PubMed ID: 23149947
Date Deposited: 10 Oct 2014 15:16
Last Modified: 05 Jan 2019 14:57
URI: http://d-scholarship.pitt.edu/id/eprint/23177

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