Jacobs, TDB and Mathew Mate, C and Turner, KT and Carpick, RW
(2013)
Understanding the tip-sample contact: An overview of contact mechanics from the macro- to the nanoscale.
In:
Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization.
UNSPECIFIED, 15 - 48.
ISBN 9781118288238
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Abstract
The field of contact mechanics was pioneered in 1880 by Heinrich Hertz who examined the problem of elastic deformation for two spheres being pressed into contact. As it forms the basis of many other contact situations including nanoscale contacts, the Hertz model is treated in this chapter in some detail. The Hertz model neglects any adhesion and friction forces between the two bodies in contact-a significant assumption given that these forces are always present to some degree and become more significant at smaller length scales. The chapter also discusses contact models to be used when adhesion cannot be neglected. It discusses how to address problems where one (or more) assumption in this model is explicitly violated, as well as special considerations that become relevant for nanoscale contacts. Many samples of interest for atomic force microscopy (AFM) studies are thin films.
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