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Understanding the tip-sample contact: An overview of contact mechanics from the macro- to the nanoscale

Jacobs, TDB and Mathew Mate, C and Turner, KT and Carpick, RW (2013) Understanding the tip-sample contact: An overview of contact mechanics from the macro- to the nanoscale. In: Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. UNSPECIFIED, 15 - 48. ISBN 9781118288238

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Abstract

© 2014 John Wiley & Sons, Inc. The field of contact mechanics was pioneered in 1880 by Heinrich Hertz who examined the problem of elastic deformation for two spheres being pressed into contact. As it forms the basis of many other contact situations including nanoscale contacts, the Hertz model is treated in this chapter in some detail. The Hertz model neglects any adhesion and friction forces between the two bodies in contact-a significant assumption given that these forces are always present to some degree and become more significant at smaller length scales. The chapter also discusses contact models to be used when adhesion cannot be neglected. It discusses how to address problems where one (or more) assumption in this model is explicitly violated, as well as special considerations that become relevant for nanoscale contacts. Many samples of interest for atomic force microscopy (AFM) studies are thin films.


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Details

Item Type: Book Section
Status: Published
Creators/Authors:
CreatorsEmailPitt UsernameORCID
Jacobs, TDBtjacobs@pitt.eduTJACOBS0000-0001-8576-914X
Mathew Mate, C
Turner, KT
Carpick, RW
Date: 8 November 2013
Date Type: Publication
Access Restriction: No restriction; Release the ETD for access worldwide immediately.
Page Range: 15 - 48
DOI or Unique Handle: 10.1002/9781118723111.ch2
Institution: University of Pittsburgh
Schools and Programs: Swanson School of Engineering > Mechanical Engineering and Materials Science
Refereed: Yes
ISBN: 9781118288238
Title of Book: Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization
Date Deposited: 10 Oct 2014 19:19
Last Modified: 02 Feb 2019 14:55
URI: http://d-scholarship.pitt.edu/id/eprint/23221

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