High repetition rate UV ultrafast laser inscription of buried channel waveguides in Sapphire: Fabrication and fluorescence imaging via ruby R lines

Benayas, A and Jaque, D and McMillen, B and Chen, KP (2009) High repetition rate UV ultrafast laser inscription of buried channel waveguides in Sapphire: Fabrication and fluorescence imaging via ruby R lines. Optics Express, 17 (12). 10076 - 10081.

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Abstract

We report on the fabrication of buried cannel waveguides in Sapphire crystals by 250-kHz high repetition rate ultrafast laser inscription with 385 nm pulses. The propagation properties of the waveguides were studied as a function of the writing conditions. The micro-fluorescence analysis of the R lines generated by trace Cr3+ dopant in Sapphire is used to elucidate the micro-structural modifications induced in the crystal network. It is revealed that waveguide has been formed due to local dilatation of the Sapphire network generated in the surroundings of the focal volume. The refractive index increment due to the dilatation induced electronic polarizability enhancement has been estimated to be of the order of Δn ≈10-4. © 2009 Optical Society of America.

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Details

Item Type:	Article
Status:	Published
Creators/Authors:	Creators Email Pitt Username ORCID Benayas, A Jaque, D McMillen, B Chen, KP pec9@pitt.edu PEC9 0000-0002-4830-0817
Date:	8 June 2009
Date Type:	Publication
Journal or Publication Title:	Optics Express
Volume:	17
Number:	12
Page Range:	10076 - 10081
DOI or Unique Handle:	10.1364/oe.17.010076
Schools and Programs:	Swanson School of Engineering > Electrical and Computer Engineering
Refereed:	Yes
MeSH Headings:	Aluminum Oxide--chemistry; Aluminum Oxide--radiation effects; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Lasers; Microscopy, Fluorescence--methods; Optical Devices; Refractometry--methods; Reproducibility of Results; Sensitivity and Specificity; Surface Properties; Ultraviolet Rays
PubMed ID:	19506659
Date Deposited:	21 Oct 2014 16:43
Last Modified:	22 Jun 2021 14:55
URI:	http://d-scholarship.pitt.edu/id/eprint/23380

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