Variation of structural, electrical, and optical properties of Zn <inf>1-x</inf>Mg <inf>x</inf>O thin films

Kim, JW and Kang, HS and Kim, JH and Lee, SY and Lee, JK and Nastasi, M (2006) Variation of structural, electrical, and optical properties of Zn <inf>1-x</inf>Mg <inf>x</inf>O thin films. Journal of Applied Physics, 100 (3). ISSN 0021-8979

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Abstract

Zn 1-xMg xO thin films on (001) sapphire substrates were deposited using pulsed laser deposition. As the substrate temperature increased, the Mg content in the Zn 1-xMg xO thin films increased and the photoluminescence (PL) peak position of the Zn 1-xMg xO thin films shifted from 370 to 356 nm, indicating a band gap expansion. Variations of the structural, electrical, and optical properties of Zn 1-xMgO thin films have been observed and analyzed by x-ray diffraction, Hall measurements, and PL measurements. © 2006 American Institute of Physics.

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Details

Item Type:	Article
Status:	Published
Creators/Authors:	Creators Email Pitt Username ORCID Kim, JW Kang, HS Kim, JH Lee, SY Lee, JK jul37@pitt.edu JUL37 0000-0002-7778-7679 Nastasi, M
Centers:	Other Centers, Institutes, Offices, or Units > Petersen Institute of NanoScience and Engineering
Date:	23 August 2006
Date Type:	Publication
Journal or Publication Title:	Journal of Applied Physics
Volume:	100
Number:	3
DOI or Unique Handle:	10.1063/1.2219153
Schools and Programs:	Swanson School of Engineering > Mechanical Engineering and Materials Science
Refereed:	Yes
ISSN:	0021-8979
Date Deposited:	18 Nov 2014 16:03
Last Modified:	22 Jun 2021 20:55
URI:	http://d-scholarship.pitt.edu/id/eprint/23473

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