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High Resolution Scanning Probes for Ferroelectric Thin Films

Ma, Hongzhou (2007) High Resolution Scanning Probes for Ferroelectric Thin Films. Doctoral Dissertation, University of Pittsburgh. (Unpublished)

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Advances in materials growth techniques enable precise control over the growth of novel functional materials such as ferroelectric thin films, which are interesting from both a physics and applications perspective. Physical properties of ferroelectric thin films differ a lot from their bulk counterparts, mainly due to the lattice mismatch at the film-substrate interface and differential thermal contraction experienced during growth. Those property anomalies are confined to a narrow range usually thinner than 1000 nm. High-resolution probes are important for understanding the spatial and temporal properties of these systems. We have developed mechanical and optical scanning probe techniques and used them to investigate various strain-engineered ferroelectric thin films. These optical and scanning probe techniques are designed to detect ferroelectric domain dynamics. Our experimental results either give direct evidence to verify material functionality, or reveal the relation between nano-scale dynamics to their macroscopic properties.


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Item Type: University of Pittsburgh ETD
Status: Unpublished
CreatorsEmailPitt UsernameORCID
ETD Committee:
TitleMemberEmail AddressPitt UsernameORCID
Committee ChairLevy, Jeremyjlevy@pitt.eduJLEVY
Committee MemberWalker,
Committee MemberPeteck, Hrvojepetek@pitt.eduPETEK
Committee MemberCoalson, Robertrob@mercury.chem.pitt.eduROBC
Committee MemberWu, Xiaolunxlwu@pitt.eduXLWU
Date: 22 June 2007
Date Type: Completion
Defense Date: 21 March 2007
Approval Date: 22 June 2007
Submission Date: 8 March 2007
Access Restriction: No restriction; Release the ETD for access worldwide immediately.
Institution: University of Pittsburgh
Schools and Programs: Dietrich School of Arts and Sciences > Physics
Degree: PhD - Doctor of Philosophy
Thesis Type: Doctoral Dissertation
Refereed: Yes
Uncontrolled Keywords: AFM; ANSOM; Confocal; Near Field Scanning Microscope; Time Resolved Measurement; Ultrafast; Atomic Force Microscope; Ferroelectric
Other ID:, etd-03082007-182413
Date Deposited: 10 Nov 2011 19:32
Last Modified: 15 Nov 2016 13:36


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