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Thermal stability of microstructural and optical modifications induced in sapphire by ultrafast laser filamentation

Benayas, A and Jaque, D and McMillen, B and Chen, KP (2010) Thermal stability of microstructural and optical modifications induced in sapphire by ultrafast laser filamentation. Journal of Applied Physics, 107 (3). ISSN 0021-8979

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Abstract

We report on the thermal stability of both structural and optical micromodifications created by ultrafast laser written filaments in sapphire crystals. By using the Cr3+ traces as optical probes, we have concluded that the filaments are constituted by both reversible and nonreversible defects with very different spatial locations. The strain field measured from the analysis of R lines has been found to be erased at the same time when the reversible centers are recombined (∼1100 °C). This fact seems to indicate that these defects act as pinning centers for the induced stress. Furthermore, we have found that the waveguide generated in the proximity of the filament disappear for annealing temperatures above 1100 °C. This clearly supports the assumption that waveguiding is produced by the strain stress induced refractive index increment based on the dominant electronic polarizability enhancement. © 2010 American Institute of Physics.


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Details

Item Type: Article
Status: Published
Creators/Authors:
CreatorsEmailPitt UsernameORCID
Benayas, A
Jaque, D
McMillen, B
Chen, KPpec9@pitt.eduPEC90000-0002-4830-0817
Date: 24 February 2010
Date Type: Publication
Journal or Publication Title: Journal of Applied Physics
Volume: 107
Number: 3
DOI or Unique Handle: 10.1063/1.3280029
Schools and Programs: Swanson School of Engineering > Electrical and Computer Engineering
Refereed: Yes
ISSN: 0021-8979
Date Deposited: 21 Oct 2014 16:34
Last Modified: 15 Jan 2021 15:55
URI: http://d-scholarship.pitt.edu/id/eprint/23280

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