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Ferroelectric properties of Pb(Zr,Ti)O<inf>3</inf> films under ion-beam induced strain

Lee, JK and Nastasi, M (2012) Ferroelectric properties of Pb(Zr,Ti)O<inf>3</inf> films under ion-beam induced strain. Journal of Applied Physics, 112 (10). ISSN 0021-8979

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Abstract

The influence of an ion-beam induced biaxial stress on the ferroelectric and dielectric properties of Pb(Zr,Ti)O3 (PZT) films is investigated using the ion beam process as a novel approach to control external stress. Tensile stress is observed to decrease the polarization, permittivity, and ferroelectric fatigue resistance of the PZT films whose structure is monoclinic. However, a compressive stress increases all of them in monoclinic PZT films. The dependence of the permittivity on stress is found not to follow the phenomenological theory relating external forces to intrinsic properties of ferroelectric materials. Changes in the ferroelectric and dielectric properties indicate that the application of a biaxial stress modulates both extrinsic and intrinsic properties of PZT films. Different degrees of dielectric non-linearity suggests the density and mobility of non-180o domain walls, and the domain switching can be controlled by an applied biaxial stress and thereby influence the ferroelectric and dielectric properties. © 2012 American Institute of Physics.

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Details

Item Type: Article
Status: Published
Creators/Authors:
CreatorsEmailPitt UsernameORCID
Lee, JKjul37@pitt.eduJUL370000-0002-7778-7679
Nastasi, M
Centers: Other Centers, Institutes, Offices, or Units > Petersen Institute of NanoScience and Engineering
Date: 15 November 2012
Date Type: Publication
Journal or Publication Title: Journal of Applied Physics
Volume: 112
Number: 10
DOI or Unique Handle: 10.1063/1.4766413
Schools and Programs: Swanson School of Engineering > Mechanical Engineering and Materials Science
Refereed: Yes
ISSN: 0021-8979
Date Deposited: 22 Oct 2014 13:33
Last Modified: 22 Jun 2021 13:56
URI: http://d-scholarship.pitt.edu/id/eprint/23383

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