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Group by: No Grouping | Volume Number of items: 1. Gujrati, Abhijeet and Khanal, Subarna and Pastewka, Lars and Jacobs, Tevis (2018) Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All Scales. ACS Applied Materials and Interfaces, 10. p. 29169. ISSN 1944-8244 |