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Precise control of phase transformation process in lead zirconate titanate thin films by focused line-beam scanning

Lee, JS and Lee, JK and Joo, SK (2007) Precise control of phase transformation process in lead zirconate titanate thin films by focused line-beam scanning. Applied Physics Letters, 90 (13). ISSN 0003-6951

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Abstract

Phase transformation and grain growth processes of lead zirconate titanate (PZT) thin films have been precisely controlled by using focused line-beam scanning. The authors promoted the lateral crystallization of PZT grains by controlling a nucleation process and increasing the size of single grains to be as large as 40 μm in length. Focused line-beam scanning allows for the selective growth and crystallization of large PZT grains on predetermined nucleation sites. The high growth rate of the selected PZT grains was attributed to successive suppression of undesirable nucleation except at predetermined positions when pretreated PZT films were exposed to the focused line beam. © 2007 American Institute of Physics.

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Details

Item Type: Article
Status: Published
Creators/Authors:
CreatorsEmailPitt UsernameORCID
Lee, JS
Lee, JKjul37@pitt.eduJUL370000-0002-7778-7679
Joo, SK
Centers: Other Centers, Institutes, Offices, or Units > Petersen Institute of NanoScience and Engineering
Date: 8 April 2007
Date Type: Publication
Journal or Publication Title: Applied Physics Letters
Volume: 90
Number: 13
DOI or Unique Handle: 10.1063/1.2719636
Schools and Programs: Swanson School of Engineering > Mechanical Engineering and Materials Science
Refereed: Yes
ISSN: 0003-6951
Date Deposited: 07 Nov 2014 17:00
Last Modified: 05 Feb 2019 19:55
URI: http://d-scholarship.pitt.edu/id/eprint/23463

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