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Chapters on Reliability

Majety, Subbarao Venkata (2023) Chapters on Reliability. Doctoral Dissertation, University of Pittsburgh. (Unpublished)

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Abstract

In this research two problems related to system reliability are addressed: the first is commonly referred to as the reliability allocation problem, and the second problem is the development of a class of optimum test plans for demonstrating system reliability.
The reliability allocation problem addressed in this research is for discrete cost-reliability data sets. Integer programming formulations are presented, and solutions are developed based on three approaches: (i) integer programming, (ii) simulated annealing, and (iii) evolutionary algorithms. Except for simple series and simple parallel systems, the integer programs formulated are non-linear. Specifically, Series-Parallel (SP) and Parallel-Series (PS) systems are discussed in detail in this research. With the integer programming approach, linear relaxations are developed for the systems and an iterative procedure is developed to solve the problems. In this iterative procedure a single infeasible solution is eliminated at each iteration until a feasible optimal solution is achieved. With the simulated annealing approach, a nested algorithm is developed, where an inner process focuses on optimality while an outer one focuses on feasibility. With the evolutionary algorithm, a dynamic penalty approach is used to accelerate the convergence of the algorithm to a good solution.
The second topic addresses test plans for systems and components. In the development of any system, testing is very important to ensure that a good system is accepted while a bad system is rejected. In this research, we address a series system with the possibility of interface failures. For these systems our research evaluates when the less expensive approach of testing only components is good enough, when it is necessary to test the whole system, and when a combination of component and system tests might be best.


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Details

Item Type: University of Pittsburgh ETD
Status: Unpublished
Creators/Authors:
CreatorsEmailPitt UsernameORCID
Majety, Subbarao VenkataSUM131@pitt.eduSUM131
ETD Committee:
TitleMemberEmail AddressPitt UsernameORCID
Committee ChairRajgopal, Jayantj.rajgopal@pitt.eduj.rajgopal
Committee MemberMaillart, Lisamaillart@pitt.edumaillart
Committee MemberBidhkori, Hodabidkhori@pitt.edubidhkori
Committee MemberMirchandani, Prakashpmirchan@katz.pitt.edupmirchan
Date: 19 January 2023
Date Type: Publication
Defense Date: 2 September 2022
Approval Date: 19 January 2023
Submission Date: 8 November 2022
Access Restriction: No restriction; Release the ETD for access worldwide immediately.
Number of Pages: 157
Institution: University of Pittsburgh
Schools and Programs: Swanson School of Engineering > Industrial Engineering
Degree: PhD - Doctor of Philosophy
Thesis Type: Doctoral Dissertation
Refereed: Yes
Uncontrolled Keywords: Reliability Allocation, Reliability Optimization, Reliability Design, Test plans, Reliability Testing, Optimal Test Plans, Heuristic Optimization, Simulated Annealing, Evolutionary Algorithm, Dynamic Penalty Function, Integer Programming
Date Deposited: 19 Jan 2023 19:21
Last Modified: 19 Jan 2023 19:21
URI: http://d-scholarship.pitt.edu/id/eprint/43799

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